3.1 Pretest
The following information is required to conduct temperature shock tests adequately.
- a. General. Information listed in Part One, paragraphs 5.7 and 5.9, and Annex A, Task 405 of this standard.
- b. Specific to this method.
- (1) Test item configuration.
- (2) Test temperature extremes or test item thermal rates of change.
- (3) Duration of exposure at each temperature.
- (4) Test item response temperature (from either Method 501.7 or 505.7).
- (5) The component/assembly/structure to be used for thermal response and temperature stabilization purposes (if required). (See Part One, paragraph 5.4.)
- (6) The number and type of shocks, i.e., shocks from low temperature to high temperature or vice-versa, or a combination of these.
MIL-STD-810H
METHOD 503.7
- c. Tailoring. Necessary variations in the basic test procedures to accommodate environments identified in the LCEP.
3.2 During Test
Collect the following information during conduct of the test:
- a. General. Information listed in Part One, paragraph 5.10, and in Annex A, Task 406 of this Standard.
- b. Specific to this method.
- (1) Record of chamber temperature versus time conditions.
- (2) Test item temperatures (measured locations).
- (3) Transfer times (e.g., "door open" to "door closed").
- (4) Duration of each exposure.
- (5) Transfer method (single or multi-chamber).
For test validation purposes, record deviations from planned or pre-test procedures or parameter levels, including any procedural anomalies that may occur.
3.3 Post-Test
The following post-test data shall be included in the test report:
- a. General. Information listed in Part One, paragraph 5.13, and in Annex A, Tasks 405 and 406 of this Standard.
- b. Specific to this method.
- (1) Test temperatures.
- (2) Duration of each exposure.
- (3) Number of cycles.
- (4) Transfer times (e.g., "door open" to "door closed").
- (5) Results of operational checks.
- (6) Status of the test item for each visual examination.
- (7) Previous test methods, if any, to which the specific test item has been exposed.
- (8) Any deviations from the original test plan.